Electrothermal analysis of VLSI systems

• 其他作者: Cheng, Yi-Kan,
• 出版: New York : Kluwer Academic Publishers ©2002.
• 稽核項: 1 online resource (xviii, 210 pages) :illustrations.
• 標題: ElectronicsCircuitsVLSI & ULSI. , COMPUTERS , Metal oxide semiconductors, Complementary , Semiconductors Thermal properties -- Mathematical models. , ElectronicsCircuitsLogic. , Thermal analysis , Metal oxide semiconductors , Integrated circuits , Thermal propertiesMathematical models. , Integrated circuits Very large scale integration -- Mathematical models. , Mathematical models. , Thermal analysis Data processing. , TECHNOLOGY & ENGINEERING , TECHNOLOGY & ENGINEERING Electronics -- Circuits -- Logic. , TECHNOLOGY & ENGINEERING Electronics -- Circuits -- VLSI & ULSI. , COMPUTERS Logic Design. , Data processing. , Electronic books. , Metal oxide semiconductors, Complementary Mathematical models. , Semiconductors , Metal oxide semiconductors Mathematical models. , Logic Design. , Very large scale integrationMathematical models.
• ISBN: 0306470241 , 9780306470240
• ISBN: 079237861X , 9780792378617
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• 附註: Includes bibliographical references and index. Part I: The building blocks: 1. Introduction -- 2. Power analysis for CMOS circuits -- 3. Temperature-dependent MOS device modeling -- 4. Thermal simulation for VLSI systems -- 5. Fast-timing electrothermal simulation. -- Part II: The applications: 6. Temperature-dependent electromigration reliability -- 7. Temperature-driven cell placement -- 8. Temperature-driven power and timing analysis.
• 摘要: Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
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• 系統號: 005297272
• 資料類型: 電子書
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