Design and analysis of integrator-based log-domain filter circuits
- 作者: Roberts, Gordon W.,
- 其他作者: Leung, Vincent W.,
- 出版: New York : Kluwer Academic ©2002.
- 稽核項: 1 online resource (xxiii, 254 pages) :illustrations.
- 叢書名: The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing,534
- 標題: TECHNOLOGY & ENGINEERING , Log domain filters Design and construction. , TECHNOLOGY & ENGINEERING Electronics -- Circuits -- General. , Bipolar integrated circuits Design and construction. , TECHNOLOGY & ENGINEERING Electronics -- Circuits -- Integrated. , Electric circuit analysis. , ElectronicsCircuitsIntegrated. , Metal oxide semiconductors, Complementary , ElectronicsCircuitsGeneral. , Electronic books. , Log domain filters , Metal oxide semiconductors, Complementary Design and construction. , Design and construction. , Bipolar integrated circuits
- ISBN: 0306475448 , 9780306475443
- ISBN: 0893-3405 ;
- 試查全文@TNUA:
- 附註: Includes bibliographical references and index.
- 摘要: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
- 電子資源: https://dbs.tnua.edu.tw/login?url=https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=67555
- 系統號: 005297683
- 資料類型: 電子書
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- 引用網址: 複製連結
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
來源: Google Book
來源: Google Book
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