Particle characterization :light scattering methods

  • 作者: Xu, Renliang.
  • 出版: New York : Kluwer Academic ©2002.
  • 稽核項: 1 online resource (xv, 397 pages) :illustrations.
  • 叢書名: Particle technology series ;13
  • 標題: TECHNOLOGY & ENGINEERING , Electronic books. , Particle size determination. , Scattering. , Light , Optics. , Particles , Particles Analysis. , Analysis. , Light Scattering. , TECHNOLOGY & ENGINEERING Optics.
  • ISBN: 6610206791 , 9786610206797
  • 試查全文@TNUA:
  • 附註: Includes bibliographical references and index. Cover -- Table of Contents -- Preface -- Acknowledgements -- Chapter 1 PARTICLE CHARACTERIZATION -- An Overview -- 1.1. Particles and Their Characterization -- 1.2. A Survey of Particle Characterization Technologies -- 1.3. Data Presentation and Statistics -- 1.4. Sample Handling -- References -- Chapter 2 LIGHT SCATTERING -- The Background Information -- 2.1. Light Scattering Phenomena and Technologies -- 2.2. Light Scattering Theory -- an Outline -- 2.3. Other Light Scattering Technologies -- References -- Chapter 3 LASER DIFFRACTION -- Sizing from Nanometers to Millimeters -- 3.1 Introduction -- 3.2. Instrumentation -- 3.3. Data Acquisition and Analysis -- 3.4. Accuracy of Laser Diffraction Technology -- References -- Chapter 4 OPTICAL PARTICLE COUNTING -- Counting and Sizing -- 4.1. Introduction -- 4.2. Instrumentation -- 4.3. Data Analysis -- References -- Chapter 5 PHOTON CORRELATION SPECTROSCOPY -Submicron Particle Characterization -- 5.1. Introduction -- 5.2 Instrumentation -- 5.3. Data Analysis -- 5.4. PCS Measurement in Concentrated Suspensions -- References -- Chapter 6 ELECTROPHORETIC LIGHT SCATTERING -- Zeta Potential Measurement -- 6.1. Introduction -- 6.2. Zeta Potential and Electrophoretic Mobility -- 6.3. Instrumentation -- 6.4. Data Analysis -- 6.5. Phase Analysis Light Scattering (PALS) -- References -- Appendix I: Symbols and Abbreviations -- Appendix II: ISO and ASTM Standards -- Appendix III: Instrument Manufacturers -- Appendix IV: Scattering Functions of a Sphere -- Appendix V: Scattering Factors for Randomly Oriented Particles -- Appendix VI: Physical Constants of Common Liquids -- Appendix VII: Refractive Index of Substances -- Author Index.
  • 摘要: "The book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided." "The book is a must for industrial users of light scattering techniques, characterizing a variety of particulate systems, and for undergraduate or graduate students, who want to learn how to use light scattering to study particular materials in chemical engineering, material sciences, physical chemistry and other related fields."--BOOK JACKET.
  • 電子資源: https://dbs.tnua.edu.tw/login?url=https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=67605
  • 系統號: 005297725
  • 資料類型: 電子書
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  • 引用網址: 複製連結