Electronic basis of the strength of materials

• 作者: Gilman, John J.
• 出版: Cambridge, UK ;New York : Cambridge University Press 2003.
• 稽核項: 1 online resource (x, 280 pages) :illustrations.
• 標題: Electronic structure. , SCIENCE , Nanoscience. , Strength of materials. , Electronic book. , Electronic books. , SCIENCE Nanoscience.
• ISBN: 0511178727 , 9780511178726
• ISBN: 0521620058
• 試查全文@TNUA:
  
• 附註: Includes bibliographical references and index. 1. Nature of elastic stiffness -- 2. Generalized stress -- 3. Generalized strain -- 4. Elastic coefficients -- 5. Properties of electrons -- 6. Quantum states -- 7. Periodic patterns of electrons -- 8. Heisenberg's Principle -- 9. Cohesion of atoms -- 10. Intramolecular cohesion -- 11. Intermolecular cohesion -- 12. Bulk modulus -- 13. Shear moduli -- 14. Entropic elasticity (polymers) -- 15. Universality and unification -- 16. Macroscopic plastic deformation -- 17. Microscopic plastic deformation -- 18. Dislocation mobility -- 19. Mechanics of cracks -- 20. Surface and interfacial energies -- 21. Fracturing rates.
• 摘要: This book is the first to relate the strength characteristics of constituent atoms to the electronic structures. The book begins with short reviews of classical and quantum mechanics followed by reviews of the three major branches of the strength of materials: elastic stiffnesses; plastic responses; and the nature of fracture.
• 電子資源: https://dbs.tnua.edu.tw/login?url=https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=120311
• 系統號: 005312740
• 資料類型: 電子書
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• 引用網址: 複製連結
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