附註:Includes bibliographical references and index.
Copyright; Preface; Contents; 1 -- An Introduction to Semiconductor Materials; 2 -- An Introduction to X-Ray Scattering; 3 -- Equipment for Measuring Diffraction Patterns; 4 -- A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index.
摘要:This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.
