Introduction to conventional transmission electron microscopy

• 作者: De Graef, Marc.
• 出版: Cambridge, U.K. ;New York, N.Y. : Cambridge University Press 2003.
• 稽核項: 1 online resource (xxi, 718 pages) :illustrations.
• 標題: SCIENCE , Nanoscience. , Durchstrahlungselektronenmikroskopie , Transmission electron microscopy. , Electronic books. , SCIENCE Nanoscience. , Microscopie électronique à transmission. , Microscopia eletrônica.
• ISBN: 0511556020 , 9780511556029
• ISBN: 0511075960 , 9780511075964 , 0511074425 , 9780511074424
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• 附註: Includes bibliographical references (pages 685-703) and index. Basic crystallography -- Basic quantum mechanics, Bragg's Law and other tools -- The transmission electron microscope -- Getting started -- Dynamical electron scattering in perfect crystals -- Two-beam theory in defect-free crystals -- Systematic row and zone axis orientations -- Defects in crystals -- Electron diffraction patterns -- Phase contrast microscopy.
• 摘要: This graduate level textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text.
• 電子資源: https://dbs.tnua.edu.tw/login?url=https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=125026
• 系統號: 005314442
• 資料類型: 電子書
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