An assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories :fisal year 1999

• 作者: National Research Council (U.S.).
• 出版: Washington, D.C. : National Academy Press ©1999.
• 稽核項: 1 online resource.
• 標題: TECHNOLOGY & ENGINEERING , Electronic books. -- local. , Evaluation. , Weights and measures -- Standards. , Measurement. , National Institute of Standards and Technology (U.S.) , National Institute of Standards and Technology (U.S.) -- Evaluation. , TECHNOLOGY & ENGINEERING Measurement. , Electronic books. , National Institute of Standards and Technology (U.S.) Evaluation.
• ISBN: 0309583640 , 9780309583640
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• 附註: Title from e-book title screen (viewed Mar. 28, 2005). Includes bibliographical references. ""An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES""; ""Copyright""; ""Preface""; ""Acknowledgment of Reviewers""; ""Contents""; ""Chapter 1 The State of the Laboratories ""; ""TECHNICAL MERIT""; ""APPROPRIATENESS OF PROGRAMS""; ""IMPACT OF PROGRAMS""; ""DNA Measurements and Standards for Forensic Laboratories""; ""Cybernetic Building Systems""; ""RESOURCES""; ""Chapter 2 Electronics and Electrical Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission"" ""Technical Merit and Appropriateness of Work""""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Electricity Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Semiconductor Electronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Radio-Frequency Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources"" ""Electromagnetic Technology Division""""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Optoelectronics Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Industrial Impact""; ""Division Resources""; ""Office of Microelectronics Programs""; ""Office of Law Enforcement Standards""; ""MAJOR OBSERVATIONS""; ""Chapter 3 Manufacturing Engineering Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work"" ""Impact of Programs""""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Precision Engineering Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Automated Production Technology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Intelligent Systems Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Manufacturing Systems Integration Division"" ""Division Mission""""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""MAJOR OBSERVATIONS""; ""Chapter 4 Chemical Science and Technology Laboratory ""; ""PANEL MEMBERS""; ""LABORATORY-LEVEL REVIEW""; ""Laboratory Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Laboratory Resources""; ""DIVISIONAL REVIEWS""; ""Biotechnology Division""; ""Division Mission""; ""Technical Merit and Appropriateness of Work""; ""Impact of Programs""; ""Division Resources""; ""Process Measurements Division""; ""Division Mission""
• 電子資源: https://dbs.tnua.edu.tw/login?url=https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=123567
• 系統號: 005315630
• 資料類型: 電子書
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• 引用網址: 複製連結
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