Fault injection techniques and tools for embedded systems reliability evaluation

• 其他作者: Benso, Alfredo. , Prinetto, Paolo.
• 出版: Boston : Kluwer Academic Publishers ©2003.
• 稽核項: 1 online resource (xiv, 241 pages) :illustrations.
• 叢書名: Frontiers in electronic testing ;23
• 標題: Systems ArchitectureGeneral. , Testing. , COMPUTERS Systems Architecture -- General. , Fiabilité. , Reliability. , COMPUTERS , Embedded computer systems Testing. , Embedded computer systems , Electronic books. , Embedded computer systems Reliability. , Systèmes enfouis (Informatique) Fiabilité. , Systèmes enfouis (Informatique) , Détection de défaut (Ingénierie) , Fault location (Engineering)
• ISBN: 030648711X , 9780306487118
• ISBN: 1402075898
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• 附註: Includes bibliographical references (pages 231-241). pt. 1. A First Look at Fault Injection -- Ch. 1.1. Fault Injection Techniques -- Ch. 1.2. Dependability Evaluation Methods -- Ch. 1.3. Soft Errors on Digital Components -- pt. 2. Hardware-Implemented Fault Injection -- Ch. 2.1. Pin-Level Hardware Fault Injection Techniques -- Ch. 2.2. Development of a Hybrid Fault Injection Environment -- Ch. 2.3. Heavy Ion Induced See in SRAM Based FPGAs -- pt. 3. Software-Implemented Fault Injection -- Ch. 3.1. "BOND": An Agents-Based Fault Injector for Windows NT -- Ch. 3.2. Xception: A Software Implemented Fault Injection Tool -- Ch. 3.3. MAFALDA: A Series of Prototype Tools for the Assessment of Real Time Cots Microkernel-Based Systems -- pt. 4. Simulation-Based Fault Injection -- Ch. 4.1. VHDL Simulation-Based Fault Injection Techniques -- Ch. 4.2. MEFISTO: A Series of Prototype Tools for Fault Injection into VHDL Models -- Ch. 4.3. Simulations-Based Fault Injection and Testing Using the Mutation Technique.
• 摘要: Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance.
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• 系統號: 005321711
• 資料類型: 電子書
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