CTL for test information of digital ICs
- 作者: Kapur, Rohit.
- 出版: Boston : Kluwer Academic Publishers 2003.
- 稽核項: 1 online resource (ix, 173 pages) :illustrations.
- 標題: Computer hardware description languages. , TestingStandards. , Electronic books. , TECHNOLOGY & ENGINEERING Electronics -- Circuits -- General. , Digital integrated circuits , TECHNOLOGY & ENGINEERING , TECHNOLOGY & ENGINEERING Electronics -- Circuits -- Integrated. , Digital integrated circuits Testing -- Standards. , computer techniques , ElectronicsCircuitsIntegrated. , circuits , engineering , Techniek (algemeen) , ElectronicsCircuitsGeneral. , computertechnieken , electrical engineering , elektrotechniek , Engineering (General) , computer software
- ISBN: 1402072937 , 9781402072932
- ISBN: 1402072937
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- 電子資源: https://dbs.tnua.edu.tw/login?url=https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=99315
- 系統號: 005322842
- 資料類型: 電子書
- 讀者標籤: 需登入
- 引用網址: 複製連結
From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability
來源: Google Book
來源: Google Book
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