查詢 au:Czanderna, Alvin Warren, ，共 2 筆
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- 出版年
- 2002(2)
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- 語言
- 英語(2)
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- 作者
- Czanderna, Alvin Warren,(2)
- Madey, Theodore E.(2)
- Powell, C. J.(2)
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- 資料類型
- 電子書(2)
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- 主題
- Surfaces (Technology)(2)
- Analysis.(1)
- Effect of radiation on.(1)
- Materials(1)
- Methodology.(1)
- Nanotechnology & MEMS.(1)
- PhysicsCondensed Matter.(1)
- SCIENCE(1)
- Surface chemistry(1)
- Surfaces (Physics)(1)
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11 0 0 0 0Beam effects, surface topography, and depth profiling in surface analysis
- 作者: Czanderna, Alvin Warren,
- 出版: New York : Kluwer Academic ©2002.
- 資料類型: 電子書
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8 0 0 0 0
Specimen handling, preparation, and treatments in surface characterization
- 作者: Czanderna, Alvin Warren,
- 出版: New York : Kluwer Academic Publishers ©2002.
- 資料類型: 電子書