查詢 text:Integrated circuits Testing. ，共 25 筆
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9 0 0 0 0Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits
- 作者: Bushnell, Michael L.
- 出版: New York : Kluwer Academic ©2002.
- 資料類型: 電子書
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6 0 0 0 0
Testing of digital systems
- 作者: Jha, Niraj K.
- 出版: Cambridge : Cambridge University Press 2003.
- 資料類型: 電子書
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6 0 0 0 0
Design for at-speed test, diagnosis, and measurement
- 作者: Nadeau-Dostie, Benoit.
- 出版: Boston : Kluwer Academic ©2000.
- 資料類型: 電子書
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10 0 0 0 0
Power-constrained testing of VLSI circuits
- 作者: Nicolici, Nicola.
- 出版: Boston : Kluwer Academic Publishers ©2003.
- 資料類型: 電子書
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10 0 0 0 0
Interconnection noise in VLSI circuits
- 作者: Moll, Francesc.
- 出版: Boston : Kluwer Academic Publishers ©2004.
- 資料類型: 電子書
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5 0 0 0 0
Verification by error modeling :using testing techniques in hardware verification
- 作者: Radecka, Katarzyna.
- 出版: Boston : Kluwer Academic Publishers 2003.
- 資料類型: 電子書
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28 0 0 0 0
Design and test of integrated inductors for RF applications
- 作者: Aguilera, Jaime.
- 出版: Boston : Kluwer Academic Publishers ©2003.
- 資料類型: 電子書
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12 0 0 0 0
Co-verification of hardware and software for ARM SoC design
- 作者: Andrews, Jason R.
- 出版: Burlington, MA : Elsevier Newnes ©2005.
- 資料類型: 電子書
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13 0 0 0 0
CTL for test information of digital ICs
- 作者: Kapur, Rohit.
- 出版: Boston : Kluwer Academic Publishers 2003.
- 資料類型: 電子書
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8 0 0 0 0
Design and analysis of integrator-based log-domain filter circuits
- 作者: Roberts, Gordon W.,
- 出版: New York : Kluwer Academic ©2002.
- 資料類型: 電子書