查詢 text:Very large scale integrationTesting. ，共 2 筆
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Power-constrained testing of VLSI circuits
- 作者: Nicolici, Nicola.
- 出版: Boston : Kluwer Academic Publishers ©2003.
- 資料類型: 電子書
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8 0 0 0 0Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits
- 作者: Bushnell, Michael L.
- 出版: New York : Kluwer Academic ©2002.
- 資料類型: 電子書